INDUSTRIAL TEST OF A/D CONVERTERS IN LABVIEW

Authors

  • Stephane Raze
  • Dominique Dallet
  • Phillipe Marchegay

DOI:

https://doi.org/10.47839/ijc.3.2.285

Keywords:

ADC dynamic test, LabVIEW

Abstract

An industrial test bench for Analog-to-Digital Converters (ADC) is presented in this article. The bench hardware has been composed with known devices of instrumentation. This hardware had been identified from ADCs under test requirements. All of hardware is handled by a software written in LabVIEW development system.

References

D.H. Sheingold. Analog-Digital Conversion Handbook, 3rd edition, Analog Devices, ed. Prentice-Hall, Englewood Cliffs.

J. Doernberg, H.-S. Lee and D.A Hodges. Full-Speed Testing of A/D Converters, IEEE J. Solid-State Circuits, December 1984, SC-19, pp.820-827.

IEEE Draft Standard 1241, “IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters”, February 2000.

EUPAS : European Project for ADC-based Devices Standardisation.

C. Morandi et al. "DYNAD : a framework IV SMT project addressed to the development of dynamic test techniques for analog-to-digital converters", Computer Standard & Interfaces, vol. 22,no. 2, pp113-119, June 2000.

Remote Programming Interface (RPI) for the HP 16700 Logic Analysis System, © Copyright Hewlett-Packard Company 1999

LabVIEW Analysis VI Reference Manual

“ADC Test Data Evaluation Program for Matlab” Home Page, http://www.mit.bme.hu/services/ieee/ ADC-test.

S. RENAUD – Contribution a la caracterisation des circuits de conversion analogique numerique. Conception et realisation d’un systeme d’evaluation dynamique de ces dispositifs. These de Doctorat, Universite Bordeaux I, 1990.

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Published

2014-08-01

How to Cite

Raze, S., Dallet, D., & Marchegay, P. (2014). INDUSTRIAL TEST OF A/D CONVERTERS IN LABVIEW. International Journal of Computing, 3(2), 43-47. https://doi.org/10.47839/ijc.3.2.285

Issue

2004, Volume 3, Issue 2

Section

Articles

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