TOOSI, T.; SIROLA, M.; LAUKKANEN, J.; VAN HEESWIJK, M.; KARHUNEN, J. METHOD FOR DETECTING AGING RELATED FAILURES OF PROCESS SENSORS VIA NOISE SIGNAL MEASUREMENT. International Journal of Computing, [S. l.], v. 18, n. 2, p. 135-146, 2019. DOI: 10.47839/ijc.18.2.1412. Disponível em: https://computingonline.net/computing/article/view/1412. Acesso em: 30 dec. 2024.