MELNYK, R.; KOROTYEYEVA, T.; LEVUS, Y. Chains Defects Detection in a Printed Circuit Board Image by the Plane Partition and Flood-filling of Traces. International Journal of Computing, [S. l.], v. 22, n. 1, p. 35-42, 2023. DOI: 10.47839/ijc.22.1.2877. Disponível em: https://computingonline.net/computing/article/view/2877. Acesso em: 25 apr. 2024.