TELLACHE, M.; LAMHENE, Y.; HARAOUBIA, B.; BAUDRAND, H. AN NUMERICAL METHOD BASED ITERATIVE PROCESS TO CHARACTERIZE MICROWAVE PLANAR CIRCUITS. International Journal of Computing, [S. l.], v. 7, n. 3, p. 86-94, 2014. DOI: 10.47839/ijc.7.3.528. Disponível em: https://computingonline.net/computing/article/view/528. Acesso em: 29 apr. 2024.