Toosi, T., M. Sirola, J. Laukkanen, M. van Heeswijk, and J. Karhunen. “METHOD FOR DETECTING AGING RELATED FAILURES OF PROCESS SENSORS VIA NOISE SIGNAL MEASUREMENT”. International Journal of Computing, vol. 18, no. 2, June 2019, pp. 135-46, doi:10.47839/ijc.18.2.1412.