TESTING OF MICROPROCESSOR DEVICES ON THE BASIS OF ARTIFICIAL NEURAL NETWORKS WITH CHANGEABLE PARAMETERS

Authors

  • Viktor Lokazyuk
  • Viktor Cheshun
  • Vitaliy Chornenkiy

DOI:

https://doi.org/10.47839/ijc.3.3.303

Keywords:

Diagnosing, digital devices, adaptive algorithms of diagnosing, artificial neural network

Abstract

The base principles of a technique of application of 3-layer feedforward fullconnected artificial neural network for execution of adaptive algorithms of testing of digital microprocessor devices are considered. The method of change of weight coefficients and thresholds of artificial neurons in the mode of operation of artificial neural network realized at the hardware level is considered. The application of this method provides implementation of adaptive algorithms of testing of the large complexity with the limited hardware resources of artificial neural network.

References

V. Lokazuk. Microprocessors and microcomputer in productions. TUP, Khmelnitskiy, 2000. p. 226.

V. Lokazuk, O. Pomorova, A. Dominov. Intellectual diagnosing of microprocessor devices and systems. Taki spravy, Khmelnitskiy-Kyiv, 2001. p. 286.

V. Lokazuk, V. Karyakin. Combined diagnosing and reliability of computing devices. Podillya, Khmelnitskiy, 1994. p. 156.

V. Lokazuk. Control and diagnosing of computing devices and systems. TUP, Khmelnitskiy, 1996. p. 175.

V. Chornenkiy, V. Cheshun. Implementation of polihotonomical procedures of diagnosing of digital devices by artificial neural networks, The Bulletin of Technological University of Podillya (1) (2001). p. 202-206.

F. Uosermen. Neural computing technique. Mir, Moscow, 1992. p. 233.

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Published

2014-08-01

How to Cite

Lokazyuk, V., Cheshun, V., & Chornenkiy, V. (2014). TESTING OF MICROPROCESSOR DEVICES ON THE BASIS OF ARTIFICIAL NEURAL NETWORKS WITH CHANGEABLE PARAMETERS. International Journal of Computing, 3(3), 35-39. https://doi.org/10.47839/ijc.3.3.303

Issue

2004, Volume 3, Issue 3

Section

Articles

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