HIGH PERFORMANCE FAULT SIMULATION FOR DIGITAL SYSTEMS

Authors

  • Vladimir Hahanov
  • Gennadiy Krivoulya
  • Irina Hahanova
  • Olga Melnikova
  • Vladimir Obrizan

DOI:

https://doi.org/10.47839/ijc.2.2.216

Keywords:

Back traced simulation, ATPG, re-convergent fan-outs, fault analysis model, deductive, parallel simulation

Abstract

Fast backttraced deductive-parallel fault simulation method oriented on processing of complex digital devices containing hundreds of thousand equivalent gates is offered. Data structures and algorithms for method realization are described.

References

V.I. Hahanov, А.V. Babich, S.M. Hyduke. Test Generation and Fault Simulation Methods on the Basis of Cubic Algebra for Digital Devices. Proc. Euromicro Symposium on Digital Systems Design, Warsaw, Poland, 2001, 228-235.

V.I. Hahanov, HM. Jahirul, Haque Masyd M.D. Mehedi. Fault analysis models of digital systems based on FPGA. Technologia i konsruirovanie v elektronnoi apparature, 2, 2001, 3-11.

V.I. Hahanov, I.Y. Sysenko, HM. Jahirul. HaqueThe Cubic Fault Simulation of Digital Circuit based on FPGA. Radio Electronics, informatics, management, 1, 2001, 123-129.

Y.H. Levendel, P.R. Menon. Comparison of fault simulation methods – Treatment of unknown signal values. Journal of Digital Systems. Vol. 4, 1980, 443-459.

M. Abramovici, M.A. Breuer, A.D. Friedman. Digital System Testing and Testable Design (Computer Science Press, 1998)

V.I. Hahanov. Technicheskaya diagnostika elementov i uzlov personalnih komputerov. Кiev: IZMN, 1997, 308p.

R. Ubar. The analysis of diagnostic tests for combinational digital circuits by fault back tracing methods. Automatica and Telemechanica, 8, 1977, 168-176.

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Published

2014-08-01

How to Cite

Hahanov, V., Krivoulya, G., Hahanova, I., Melnikova, O., & Obrizan, V. (2014). HIGH PERFORMANCE FAULT SIMULATION FOR DIGITAL SYSTEMS. International Journal of Computing, 2(2), 114-121. https://doi.org/10.47839/ijc.2.2.216

Issue

2003, Volume 2, Issue 2

Section

Articles

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