TESTING AND DIAGNOSIS OF DISTRIBUTED DIGITAL SYSTEMS

Authors

  • Vladimir Hahanov
  • Vladimir Yeliseev
  • Alexander Parfenty

DOI:

https://doi.org/10.47839/ijc.5.1.386

Keywords:

Network on Chip, System on chip, digital board, crate, testability standards, IP-Core, Integrated circuit, ARM processor

Abstract

The complex system can be represented as hierarchy of simpler components. On the one hand different levels of hierarchy have an advantage for more deeply research of properties of the complex system. On the other hand a flexible model and method of testing and diagnosing of the complex system need to be developed. Moreover, international IEEE testability standards should be applied.The research presented in the current paper offers approach of testing of complex digital system based on hierarchy scaling during diagnosis experiment. Several models of testing are proposed. Main principles of testing system organization are given. The result of the work is significant time reduction of test and diagnostic of system overall.

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Published

2014-08-01

How to Cite

Hahanov, V., Yeliseev, V., & Parfenty, A. (2014). TESTING AND DIAGNOSIS OF DISTRIBUTED DIGITAL SYSTEMS. International Journal of Computing, 5(1), 86-91. https://doi.org/10.47839/ijc.5.1.386

Issue

2006, Volume 5, Issue 1

Section

Articles

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