CENTRALISED DIAGNOSTICS OF ELECTRONIC AND ELECTRIC EQUIPMENT IN VEHICLES, ENGINE LIGHTING EQUIPMENT TESTING
DOI:
https://doi.org/10.47839/ijc.7.2.507Keywords:
Centralized diagnostics, engine lighting equipment, integral transforms, spark gap modelAbstract
Today’s diagnostic systems used in vehicles are based on separate diagnostic subsystems for each electronic or electric device. The basic idea of the project is to develop a centralized diagnostic method to cover most of functional systems. The proposed method would expedite the overall testing time and bring other significant advantages such as savings on test equipment. This paper deals with engine lighting equipment testing technique. The fundamental idea is that both electronic and electric devices in a vehicle have a relationship to communication control busses. Each device can also be described as an electrical consumer with its typical power consumption characteristics. Hence, the proposed diagnostic method is based on investigating transient profile on power lines of a tested device whilst changing its state from off to on. The short time Fourier transform (STFT) processing is then applied to analyze the gained signal. The analysis results evaluate the condition of the engine lighting equipment.References
Richard O. Duda, Peter E. Hart, David G.Stork, Pattern Classification 2nd edition, John Wiley & sons, Inc, New York, 2001. ISBN 0-471-05669-3.
Jakub Kral, Petr Jezdik, Analyza chovani zapalovaciho ustroji v automobilu Skoda (in Czech), study independent thesis, November 2006.
Doc.RNDr. Pavel Kubes, CSc.,doc.RNDr. Zdenek Kyncl, DrSc. Fyzika 1, Vydavatelstvi CVUT, Zikova 4, 16635 Praha 6.
Doc. Marcel Kreidl a kolektiv Diagnosticke systemy, Vydavatelstvi CVUT, Zikova 4, 16635 Praha 6.
Intusoft Newsletter, Personal Computer Circuit & System Design Tools, Issue#50 Sept. 1997 pp.9-12
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Published
2014-08-01
How to Cite
Ježdík, P., & Novák, J. (2014). CENTRALISED DIAGNOSTICS OF ELECTRONIC AND ELECTRIC EQUIPMENT IN VEHICLES, ENGINE LIGHTING EQUIPMENT TESTING. International Journal of Computing, 7(2), 30-34. https://doi.org/10.47839/ijc.7.2.507
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